JPH0439584Y2 - - Google Patents
Info
- Publication number
- JPH0439584Y2 JPH0439584Y2 JP1984186100U JP18610084U JPH0439584Y2 JP H0439584 Y2 JPH0439584 Y2 JP H0439584Y2 JP 1984186100 U JP1984186100 U JP 1984186100U JP 18610084 U JP18610084 U JP 18610084U JP H0439584 Y2 JPH0439584 Y2 JP H0439584Y2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- burn
- heater
- timer
- test object
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984186100U JPH0439584Y2 (en]) | 1984-12-10 | 1984-12-10 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984186100U JPH0439584Y2 (en]) | 1984-12-10 | 1984-12-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61102880U JPS61102880U (en]) | 1986-06-30 |
JPH0439584Y2 true JPH0439584Y2 (en]) | 1992-09-16 |
Family
ID=30743563
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1984186100U Expired JPH0439584Y2 (en]) | 1984-12-10 | 1984-12-10 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0439584Y2 (en]) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57124264A (en) * | 1981-01-26 | 1982-08-03 | Fujitsu Ltd | Burn-in testing equipment |
JPS58155375A (ja) * | 1982-03-11 | 1983-09-16 | Nec Ic Microcomput Syst Ltd | 半導体装置の電圧印加高温連続試験法 |
-
1984
- 1984-12-10 JP JP1984186100U patent/JPH0439584Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS61102880U (en]) | 1986-06-30 |
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